2022 Computer Vision Conference Paper

Fabric Defect Detection Using Gray Level Co-occurrence Matrix and Local Binary Pattern

Ushik Shrestha Khwakhali, Nguyen Thu Tra, Huynh Vinh Tin, T. D. Khai, C. Q. Tin, Loh Ing Hoe

RIVF 2022, Ho Chi Minh City, Vietnam

Abstract

Applies Gray Level Co-occurrence Matrix (GLCM) and Local Binary Pattern (LBP) texture-analysis techniques to automated fabric defect detection.

Keywords

Computer VisionDefect DetectionTexture Analysis

APA-style Citation

Ushik Shrestha Khwakhali, Nguyen Thu Tra, Huynh Vinh Tin, T. D. Khai, C. Q. Tin, Loh Ing Hoe (2022). Fabric Defect Detection Using Gray Level Co-occurrence Matrix and Local Binary Pattern. RIVF 2022, Ho Chi Minh City, Vietnam. https://doi.org/10.1109/RIVF55975.2022.10013920

BibTeX

@inproceedings{Khwakhali2022fabric,
  author    = {Ushik Shrestha Khwakhali and Nguyen Thu Tra and Huynh Vinh Tin and T. D. Khai and C. Q. Tin and Loh Ing Hoe},
  title     = {Fabric Defect Detection Using Gray Level Co-occurrence Matrix and Local Binary Pattern},
  year      = {2022},
  booktitle = {RIVF 2022, Ho Chi Minh City, Vietnam},
  doi       = {10.1109/RIVF55975.2022.10013920},
  url       = {https://www.researchgate.net/publication/367263530_Fabric_Defect_Detection_Using_Gray_Level_Co-occurence_Matrix_and_Local_Binary_Pattern}
}